HEFBT from NEXPERIA >> Specification: Decade Counter, 30 MHz, 1 Gate, 1 Input, 3 V to 15 V, SOIC Technical Datasheet: HEFBT Datasheet. HEFBT, Nexperia Counter ICs 5-STAGE JOHNSON COUNTER datasheet, inventory, & pricing. HEFBT datasheet, HEFBT circuit, HEFBT data sheet: PHILIPS – 5 -stage Johnson counter,alldatasheet, datasheet, Datasheet search site for.
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In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail.
HEFBT, – NXP Semiconductors – Free Library Parts
Revision dattasheet Table Static characteristics Table 6. Measurement points given in Table 9. Rename the pins throughout to be consistent with rest of HEF family.
Test circuit Table The latest product status information is available on datasheeet Internet at URL http: Limiting values Table 4. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. Applications — Applications that are described herein for any of these products are for illustrative purposes only.
Automatic counter code correction is provided by an internal circuit: Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where dtasheet or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage.
In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.
Decoded outputs are sequential within each stage and from stage to stage, with no dead time except propagation delay. When cascading counters, the Q output, which is LOW while the counter is in states 5, 6, 7, 8, and 9, can be used to drive the CP0 input of the next counter. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information.
The content is still under internal review and subject to formal approval, which may result in modifications or additions. Definitions for test circuit: This document supersedes and replaces all information supplied prior to the publication hereof.
HEFBT, Datasheet (PDF Download) 5/18 Page – NXP Semiconductors
For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. For more information, please visit: Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice.
NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Dynamic characteristics Table 7.
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All referenced brands, product names, service names and trademarks are the property of their respective owners. Exposure to limiting values for extended periods may affect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http: Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Functional description Table 3. NXP Semiconductors does not give any representations or warranties as to the het4017bt or completeness of information included herein and shall have no liability for the consequences of use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number s and title. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
Ordering information Table 1. Recommended operating conditions Table 5.
Package SOT74 removed from Section 4. Plastic or metal protrusions of 0. Dynamic power dissipation PD PD can be calculated from the formulas shown.
Contact information For more information, please visit: Schmitt trigger action makes hrf4017bt clock inputs highly tolerant of slower rise and fall times. Limiting values — Stress above one or more limiting values as defined in the Absolute Maximum Ratings System of IEC may cause permanent damage to the device.
IEE logic symbol 6. Product [short] data sheet Production This document contains the product specification. Limiting values are stress ratings only and operation of the device at hef4017ht or any other conditions above those given in the Characteristics sections of this document is not implied.